Tabletop high and low temperature test chamber

The desktop high and low temperature (damp heat) test chamber meets MIL, STD, GB, GJB, JIS, JEDEC, IEC and other testing standards, and can accommodate customization requirements for small volumes from 26L to 80L. It can simulate environments for high and low temperature, high and low temperature cycles, alternating damp heat, constant temperature and humidity, and low temperature and low humidity reliability tests.

1. Application Fields: Semiconductor chips, research institutions, third-party laboratories, quality inspection, new energy, new materials, optoelectronic communications, aerospace and military industry, automotive industry, LCD displays, medical and other technology industries.

2. Meets test standards: GB/T 2423.1 Low Temperature Test Method; GB/T 2423.2 High-temperature test methods; GB/T2423.34 Test method for damp heat cycles; IEC60068-2 Temperature and humidity test method; GJB 150.3 High Temperature Test; GJB 150.4 Low temperature test; GJB 150.9 Damp heat test; MIL-STD-202G-103B humidity test;